MIL-DTL-17587C(SH)
4.5.10 Dielectric strength.
4.5.10.1 Test equipment. Tests for dielectric strength shall be made with an alternating potential from a 1
kilowatt or larger power source having a sinusoidal wave shape. Semiconductors shall be shunted or disconnected
for protection during tests.
4.5.10.2 Voltage magnitude.
4.5.10.2.1 Full voltage. The applicable voltage magnitude specified in 3.4.10.3 shall be applied as specified in
Table V.
4.5.10.2.2 Reduced voltage. Sixty percent of the applicable voltage magnitude specified in 3.4.10.3 shall be
applied as specified in Table V.
4.5.10.3 Voltage application/duration and pass/fail criteria. The voltage shall be applied for a period of 1
minute without insulation breakdown between the test points and under the conditions specified in 4.5.10.3.1. The
applied potential shall be increased gradually until the correct test value is reached.
4.5.10.3.1 Circuit breaker, attachments, and cradle configuration. The circuit breaker shall have all applicable
attachments installed and this entire configuration shall be installed in the cradle.
4.5.10.3.1.1 Circuit breaker poles and ground used as test points. The voltage shall be applied between the
points marked with an "X" in Tables XV and XVI with the circuit breaker in the state (open, closed) specified in
TABLE XV. Dielectric strength test points (circuit breaker poles and ground) with
circuit breaker open.
Circuit breaker
Load side terminals on cradle
open
Ground
Left
Center
Right
pole
pole
pole
Line side
Left pole
X
X
terminals
on cradle
Center pole
X
X
X
X
Right pole
X
Ground
X
X
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